EDS EDAX Analysis

Accurate EDS EDAX Analysis With Quick Turnaround

EDS EDAX Analysis

Sage Analytical Laboratories can provide material characterization through our Energy Dispersive Spectroscopy (EDS) detector located within our Scanning Electron Microscope (SEM) systems.

Through various implementations of the EDS EDAX method, different signals can be constructed. Doing a point dwell spectrum will reveal what elements are present, as well as relative compositional weight.

Dot maps on the other hand provide a visual method of summarizing elements contained within the field of view and outline their locations for an easy to understand picture. Through false coloring, a well-defined map of elements reveals the full composition of the area of interest.

This is ideal for finding how well a process is centered, what contaminates may lie in or on devices, or what material a physical defect is made from whether it is a layer or a point defect. Elemental analysis helps identify root cause by giving the probably location within assembly and lifetime where the defect occurred.

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