Advanced Mapping and Quantification Using EDS/EDX/XEDS Analysis
Sage Analytical Laboratories can provide material characterization through our Energy Dispersive X-Ray Spectroscopy (EDS/EDX/XEDS) detectors, which are located within our FEI Quanta 3D FEG and FEI Helios Nanolab 660 Scanning Electron Microscope (SEM) systems. The lab is equipped with an EDAX system along with a brand new Bruker XFlash® 6 | 60 Silicon Drift Detector (SDD).
In operation, both EDS/EDX/XEDS systems provide the same high quality results ideal for the qualification and quantification of a production process. Similar to the original X-Ray radiation detector technology used in the EDAX detector, the SDD offers relatively higher count rates, sufficient resolution at higher energies, and lower maintenance thermoelectric cooling in comparison with the liquid nitrogen for the EDAX detector.
Rather than relying on the clunky, large wavelengths of the visible light spectrum, SEMs create an image at much higher magnifications by accelerating electrons into a sample which then reflect back in a similar manner to visible light. Interactions between the electron beam with a sample lead to the excitation of characteristic X-Rays, which are well documented and therefore known to be specific to each element for use with the EDS/EDX/XEDS system.
By recording these characteristic X-Rays, the EDS/EDX/XEDS analysis equipment software produces an elemental spectrum which must then be interpreted by one of our professional staff. Although the data is extremely accurate, it is necessary to screen the results in order to ascertain whether false elemental peaks were automatically identified by the software.
In addition to producing an elemental spectrum for a single point, the advanced EDS/EDX/XEDS analysis software included with the equipment allows for our team of scientists, engineers, and technicians to provide chemical, elemental, or material analysis over multiple points, a line, or an area. Most impressive are images known as a hypermap in which a colorful image is produced in order to properly visualize the location of the elements on an area of your sample.